Scanning Probe Microscopy and Atomic Force Analysis

σε πρόσθεσε στο Wellness

2025-12-22 10:00:06 -

Scanning Probe Microscopy (SPM) represents a departure from traditional "lens-based" imaging. Instead of using light or electrons, SPM utilizes a physical probe that "feels" the surface of a specimen. The most common variant, Atomic Force Microscopy (AFM), uses a sharp tip on a cantilever to measure mechanical forces between the tip and the sample. As the tip moves across the surface, a laser...

0 Σχόλια 0 Μοιράστηκε 9 Views 0 Προεπισκόπηση