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Sonu Pawar Ajouter une nouvelle offre d'emploi Wellness
2025-12-22 10:00:06 -

Scanning Probe Microscopy and Atomic Force Analysis
Scanning Probe Microscopy (SPM) represents a departure from traditional "lens-based" imaging. Instead of using light or electrons, SPM utilizes a physical probe that "feels" the surface of a specimen. The most common variant, Atomic Force Microscopy (AFM), uses a sharp tip on a cantilever to measure mechanical forces between the tip and the sample. As the tip moves across the surface, a laser...

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Sonu Pawar Ajouter une nouvelle offre d'emploi Wellness
2025-12-22 10:00:06 -

Scanning Probe Microscopy and Atomic Force Analysis
Scanning Probe Microscopy (SPM) represents a departure from traditional "lens-based" imaging. Instead of using light or electrons, SPM utilizes a physical probe that "feels" the surface of a specimen. The most common variant, Atomic Force Microscopy (AFM), uses a sharp tip on a cantilever to measure mechanical forces between the tip and the sample. As the tip moves across the surface, a laser...

0 Commentaires 0 Parts 9 Vue 0 Aperçu

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